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-irradiation on latent tracks of polyethylene terephthalate (PET) filmHiroki, Akihiro; Asano, Masaharu; Yamaki, Tetsuya; Yoshida, Masaru
Chemical Physics Letters, 406(1-3), p.188 - 191, 2005/04
Times Cited Count：10 Percentile：32.95(Chemistry, Physical)The pre-treatment effect of -irradiation on latent tracks of polyethylene terephthalate (PET) films bombarded with swift heavy ions was investigated by electric conductometry and scanning electron microscopy (SEM) observation. The Xe-ion bombarded PET films were etched for 6 hours in 0.2 M NaOH aqueous solution at 70
C to prepare track-etched membranes. As -irradiation doses increased in the range of 0-160 kGy, the pore diameter obtained by SEM observation decreased while that obtained by conductometry became large. This inconsistent result between the two methods was due to an increase in the crosslinked region in the latent tracks caused by -irradiation.
Asano, Masaharu; Yoshida, Masaru
Kogyo Zairyo, 52(12), p.65 - 69, 2004/12
no abstracts in English
Takahashi, Shuichi*; Yoshida, Masaru; Asano, Masaharu; Nakagawa,Tsutomu*
Polymer Journal, 36(1), p.50 - 53, 2004/01
Times Cited Count：4 Percentile：12.7(Polymer Science)The poly(ethylen terephthalate)(PET) membrane, which has a membrane thickness of 12
m, was used in this study. PET is a polymer widely used for fibers, films and bottles. It was assumed that for PET, which is often used as a gas barrier film, it is easy to effect changes in its gas permeability by modification, such as by ion irradiation. Previously, I reported the effect of heavy ion irradiation on the gas permeation of a PET membrane. A portion of the heavy ion irradiated PET membranes exhibited the Knudsen flow during the gas permeation measurements. As a next step, therefore, I applied an etching technique utilizing NaOH solution to control the nanosized pore of the heavy ion irradiated PET membrane. PET membranes irradiated at a fluence of 3
10
ions/cm
were etched in 6N or 1N NaOH solution at 60C. The etching time was controlled to observe the changes in the gas permeation behavior depended on the etchig. This objective has consequently been used to control the Knudsen flow.
Sato, Yasunori*; Yamaguchi, Daichi*; Oshima, Akihiro*; Kato, Takanori*; Ikeda, Shigetoshi*; Aoki, Yasushi*; Tanaka, Shigeru; Tabata, Yoneho*; Washio, Masakazu*
JAERI-Conf 2003-001, p.245 - 250, 2003/03
no abstracts in English
Yoshida, Masaru; Yamaki, Tetsuya
Saishin Nenryo Denchi Buzai; Sono Saisentan Gijutsu To Shinraisei Hyoka, p.82 - 92, 2003/00
no abstracts in English
Apel, P. Y.*; Korchev, Y. E.*; Siwy, Z.*; Spohr, R.*; Yoshida, Masaru
Nuclear Instruments and Methods in Physics Research B, 184(3), p.337 - 346, 2001/11
Times Cited Count：477 Percentile：99.96(Instruments & Instrumentation)no abstracts in English
Kawasuso, Atsuo; Kojima, Kazutoshi; Yoshikawa, Masahito; Ito, Hisayoshi; Narumi, Kazumasa
Applied Physics Letters, 76(9), p.1119 - 1121, 2000/02
Times Cited Count：21 Percentile：65.08(Physics, Applied)no abstracts in English
Asano, Masaharu; Maekawa, Yasunari; Yoshida, Masaru
JAERI-Review 99-025, TIARA Annual Report 1998, p.87 - 88, 1999/10
no abstracts in English
Saito, Kazunari; Yoshikawa, Masahito; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Takahashi, Yoshihiro*; Onishi, Kazunori*
JAERI-Conf 97-003, p.243 - 248, 1997/03
no abstracts in English
Yoshida, Masaru; Nagaoka, Noiyasu*; Asano, Masaharu; Omichi, Hideki; Kubota, Hitoshi*; Ogura, K.*; Vetter, J.*; Spohr, R.*; Katakai, Ryoichi*
Journal of Nuclear Materials, 122(1), p.39 - 44, 1997/00
no abstracts in English
Yoshikawa, Masahito; *; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Yoshida, Sadafumi*; Okumura, Hajime*; Takahashi, Yoshihiro*; Onishi, Kazunori*
Journal of Applied Physics, 80(1), p.282 - 287, 1996/07
Times Cited Count：22 Percentile：70.66(Physics, Applied)no abstracts in English
Yoshikawa, Masahito; *; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Okumura, Hajime*; Yoshida, Sadafumi*
14th Symp. on Materials Science and Engineering, Research Center of Ion Beam Technology, Hosei Univ., 0, p.159 - 165, 1996/00
no abstracts in English
/SiO
system*; Sekiguchi, Tetsuhiro; Tanaka, Kenichiro*
Atomic Collision Research in Japan Progress Report,Vol. 21, 0, p.104 - 105, 1996/00
no abstracts in English
Komaki, Yoshihide; ; Morishita, Norio; *
Radiat. Meas., 26(1), p.123 - 129, 1996/00
Times Cited Count：22 Percentile：84.87(Nuclear Science & Technology)no abstracts in English
annealing due to -ray irradiation; Gate voltage dependenceImaki, Shunsaku*; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*
Heisei-7-Nendo Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Rombunshu, 0, p.151 - 152, 1995/00
no abstracts in English
*; *; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*
Heisei-7-Nendo Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Rombunshu, 0, p.153 - 154, 1995/00
no abstracts in English
Komaki, Yoshihide;
Hoshasen, 21(2), p.3 - 9, 1995/00
no abstracts in English
Tamada, Masao; Asano, Masaharu; Spohr, R.*; Vetter, J.*; Trautmann, C.*; Yoshida, Masaru; Katakai, Ryoichi*; Omichi, Hideki
Macromolecular Rapid Communications, 16, p.47 - 51, 1995/00
Times Cited Count：8 Percentile：42.86(Polymer Science)no abstracts in English
Onishi, Kazunori*; Takahashi, Yoshihiro*; Imaki, Shunsaku*; *; Yoshikawa, Masahito
Proc. of 21st Int. Symp. for Testing and Failure Analysis (ISTFA 95), 0, p.269 - 274, 1995/00
no abstracts in English
Komaki, Yoshihide; ; Sakurai, Tsutomu
Radiat. Meas., 24(2), p.193 - 196, 1995/00
Times Cited Count：5 Percentile：58.38(Nuclear Science & Technology)no abstracts in English
